D. N. Makarov, M. K. Eseev, E. S. Gusarevich, K. A. Makarova, M. S. Borisov
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引用次数: 0
Abstract
The X-ray diffraction analysis is one of the main methods to determine the structure of crystalline materials using both cw X rays and ultrashort pulses. Ultrashort pulses are usually utilized to observe dynamic processes in atomic and molecular systems. In this work, it has been shown that ultrashort pulses can have another important application in the determination of the interplanar distance between diamond layers with NV centers, which can be separated by only several angstroms. The obtained results can be extended to more complex structures and can be finally developed to a new three-dimensional tomography method with angstrom resolution.
X 射线衍射分析是确定晶体材料结构的主要方法之一，可同时使用 cw X 射线和超短脉冲。超短脉冲通常用于观察原子和分子系统的动态过程。在这项工作中，超短脉冲被证明在确定具有 NV 中心的金刚石层之间的平面间距方面具有另一项重要应用，这些金刚石层之间的间距只有几埃。获得的结果可以扩展到更复杂的结构，并最终发展成一种具有埃级分辨率的新型三维层析成像方法。
期刊介绍：
All topics of experimental and theoretical physics including gravitation, field theory, elementary particles and nuclei, plasma, nonlinear phenomena, condensed matter, superconductivity, superfluidity, lasers, and surfaces.
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