Embedding of cluster models of oxides: Implications for XPS predictions

IF 1.5 4区 物理与天体物理 Q2 SPECTROSCOPY Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2025-01-01 Epub Date: 2024-12-15 DOI:10.1016/j.elspec.2024.147511
Paul S. Bagus , Connie J. Nelin
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引用次数: 0

Abstract

The importance of embedding cluster models of NiO that are used to predict and analyze the Ni 2p XPS spectra in this compound is studied. The XPS obtained with an isolated NiO6 cluster are compared with those obtained with the cluster embedded in a point charge field designed to reproduce the Madelung potential of the crystal. It is found that there is a remarkable and possibly unexpected similarity between the theoretical XPS spectra with and without point charge embedding. It is believed that this can be expected to be a general conclusion relevant for the XPS of other ionic compounds.
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氧化物簇模型的嵌入:对XPS预测的影响
研究了在该化合物中嵌入NiO簇模型用于预测和分析ni2p XPS光谱的重要性。将分离NiO6团簇得到的XPS与嵌入点电荷场得到的XPS进行了比较,以重现晶体的马德隆电位。发现在有和没有嵌入点电荷的情况下,理论XPS光谱有显著的、可能是意想不到的相似性。相信这一结论对其他离子化合物的XPS分析具有普遍意义。
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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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