Hongxin Zhang;Teng Ran;Wendong Xiao;Kai Lv;Song Peng;Liang Yuan;Jingchuan Wang
{"title":"Multi-Scale Progressive Fusion Network for Low-Light Image Enhancement","authors":"Hongxin Zhang;Teng Ran;Wendong Xiao;Kai Lv;Song Peng;Liang Yuan;Jingchuan Wang","doi":"10.1109/TIM.2025.3529580","DOIUrl":null,"url":null,"abstract":"Low-light images affect human perception and vision tasks because of low brightness, loss of details, and severe noise. Most existing methods adopt a multibranch structure with a refusion strategy to solve different image defects separately. However, the correlation between the multi-scale information of images has always been ignored, and the ability of multifeature fusion needs to be improved. In the article, we propose a multi-scale progressive fusion network to obtain feature representation by interacting with different resolution information. Concretely, sampling blocks based on dual-channel superposition are used to acquire different resolution features. We propose a feature fusion block that utilizes local perception and linear correlation to exchange information across resolution layers. An enhancement block based on depth and cyclic residual features is presented to improve brightness and details and suppress noise in different resolution layers. In addition, we introduce a set of loss functions to optimize the model parameters. The proposed method performs better on public datasets and real scenarios.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-11"},"PeriodicalIF":5.6000,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10855679/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Low-light images affect human perception and vision tasks because of low brightness, loss of details, and severe noise. Most existing methods adopt a multibranch structure with a refusion strategy to solve different image defects separately. However, the correlation between the multi-scale information of images has always been ignored, and the ability of multifeature fusion needs to be improved. In the article, we propose a multi-scale progressive fusion network to obtain feature representation by interacting with different resolution information. Concretely, sampling blocks based on dual-channel superposition are used to acquire different resolution features. We propose a feature fusion block that utilizes local perception and linear correlation to exchange information across resolution layers. An enhancement block based on depth and cyclic residual features is presented to improve brightness and details and suppress noise in different resolution layers. In addition, we introduce a set of loss functions to optimize the model parameters. The proposed method performs better on public datasets and real scenarios.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.