NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY

Hai Xu, X. Xie, M. Zilani, Wei Chen, A. Wee
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引用次数: 2

Abstract

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.
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扫描隧道显微镜纳米尺度表征
纳米尺度表征是纳米科学和技术的一个关键领域,因为它提供了对材料的性质和功能的基本理解,直到原子和分子尺度。本文综述了扫描隧道显微镜(STM)技术在纳米尺度表征中的发展及其应用。我们将讨论扫描隧道显微镜的工作原理、实验装置、工作模式和针尖制备方法。本文列举了一些例子来说明STM在半导体纳米表征中的应用。此外,讨论了自旋极化STM (SP-STM)和多探针STM (MP-STM)等STM技术的新进展,并与传统的非磁性和单尖端STM方法进行了比较。
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