M. Morita, H. Tomita, Ryohei Ohtake, Keita Kanenari, Atsushi Nakamura, Kosuke Saito, Toshihide Kawai, Takeo Okumura, V. Sonnenschein, T. Sakamoto
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引用次数: 2
Abstract
Development of a micro imaging system for element-selective analysis by coupling of focused ion beam and resonance ionization mass spectrometry Masato Morita, Hideki Tomita, Ryohei Ohtake, Keita Kanenari, Atsushi Nakamura, Kosuke Saito, Toshihide Kawai, Takeo Okumura, Volker Sonnenschein and Tetsuo Sakamoto Department of Applied Physics, Kogakuin University, 2665-1 Nakano-machi, Hachioji-shi, Tokyo-to, 192-0015, Japan; Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya-shi, Aichi-ken, 464-8603, Japan; Japan Neutron Optics Inc., 20-5, Takeshima-cho, Gamagori-shi, Aichi-ken, 443-0031, Japan
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