{"title":"工业自动化中的不良气味:嗅出功能嫉妒","authors":"Lisa Sonnleithner, Rick Rabiser, Alois Zoitl","doi":"10.1109/SEAA56994.2022.00061","DOIUrl":null,"url":null,"abstract":"Bad Smells are sub-optimal software structures or patterns. They can obstruct the understandability of a software system and cause maintenance issues. As a result, it is critical to avoid Bad Smells. While the subject is well-researched in software engineering, it remains an unresolved issue in industrial automation, e.g., when developing control software in the context of a Cyber-Physical Production System (CPPS). In this short paper, we present possible detection methods for Feature Envy, a smell that indicates bad modularization of a software system. We explain how these methods can be applied to analyze control software developed in IEC 61499. We present first results as well as next steps.","PeriodicalId":269970,"journal":{"name":"2022 48th Euromicro Conference on Software Engineering and Advanced Applications (SEAA)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Bad Smells in Industrial Automation: Sniffing out Feature Envy\",\"authors\":\"Lisa Sonnleithner, Rick Rabiser, Alois Zoitl\",\"doi\":\"10.1109/SEAA56994.2022.00061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Bad Smells are sub-optimal software structures or patterns. They can obstruct the understandability of a software system and cause maintenance issues. As a result, it is critical to avoid Bad Smells. While the subject is well-researched in software engineering, it remains an unresolved issue in industrial automation, e.g., when developing control software in the context of a Cyber-Physical Production System (CPPS). In this short paper, we present possible detection methods for Feature Envy, a smell that indicates bad modularization of a software system. We explain how these methods can be applied to analyze control software developed in IEC 61499. We present first results as well as next steps.\",\"PeriodicalId\":269970,\"journal\":{\"name\":\"2022 48th Euromicro Conference on Software Engineering and Advanced Applications (SEAA)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 48th Euromicro Conference on Software Engineering and Advanced Applications (SEAA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SEAA56994.2022.00061\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 48th Euromicro Conference on Software Engineering and Advanced Applications (SEAA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SEAA56994.2022.00061","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bad Smells in Industrial Automation: Sniffing out Feature Envy
Bad Smells are sub-optimal software structures or patterns. They can obstruct the understandability of a software system and cause maintenance issues. As a result, it is critical to avoid Bad Smells. While the subject is well-researched in software engineering, it remains an unresolved issue in industrial automation, e.g., when developing control software in the context of a Cyber-Physical Production System (CPPS). In this short paper, we present possible detection methods for Feature Envy, a smell that indicates bad modularization of a software system. We explain how these methods can be applied to analyze control software developed in IEC 61499. We present first results as well as next steps.
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