V. Khmelev, S. V. Levin, S. Khmelev, S. N. Tsyganok
{"title":"超声波设备运行效率下降的原因分析","authors":"V. Khmelev, S. V. Levin, S. Khmelev, S. N. Tsyganok","doi":"10.1109/EDM.2014.6882517","DOIUrl":null,"url":null,"abstract":"The article presents the results of studies allowing us to reveal the operation condition of the ultrasonic apparatuses with multi half-wave radiators in confined space, at which efficiency of ultrasonic influence on the technological process decreases and essential deviation from nominal operation mode is observed, that can lead to the failure of the ultrasonic equipment.","PeriodicalId":332225,"journal":{"name":"2014 15th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Determination of the reasons of efficiency decrease in the operation of ultrasonic apparatuses\",\"authors\":\"V. Khmelev, S. V. Levin, S. Khmelev, S. N. Tsyganok\",\"doi\":\"10.1109/EDM.2014.6882517\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article presents the results of studies allowing us to reveal the operation condition of the ultrasonic apparatuses with multi half-wave radiators in confined space, at which efficiency of ultrasonic influence on the technological process decreases and essential deviation from nominal operation mode is observed, that can lead to the failure of the ultrasonic equipment.\",\"PeriodicalId\":332225,\"journal\":{\"name\":\"2014 15th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-08-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 15th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDM.2014.6882517\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 15th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDM.2014.6882517","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Determination of the reasons of efficiency decrease in the operation of ultrasonic apparatuses
The article presents the results of studies allowing us to reveal the operation condition of the ultrasonic apparatuses with multi half-wave radiators in confined space, at which efficiency of ultrasonic influence on the technological process decreases and essential deviation from nominal operation mode is observed, that can lead to the failure of the ultrasonic equipment.
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