用于微电子系统ESD保护的瞬态-数字转换器设计

2008 IEEE Asian Solid-State Circuits Conference Pub Date : 2008-12-12 DOI:10.1109/ASSCC.2008.4708814

M. Ker, Cheng-Cheng Yen, C. Liao, Tung-Yang Chen, Chih-Chung Tsai

{"title":"用于微电子系统ESD保护的瞬态-数字转换器设计","authors":"M. Ker, Cheng-Cheng Yen, C. Liao, Tung-Yang Chen, Chih-Chung Tsai","doi":"10.1109/ASSCC.2008.4708814","DOIUrl":null,"url":null,"abstract":"An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-mum CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.","PeriodicalId":143173,"journal":{"name":"2008 IEEE Asian Solid-State Circuits Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2008-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Transient-to-digital converter for ESD protection design in microelectronic systems\",\"authors\":\"M. Ker, Cheng-Cheng Yen, C. Liao, Tung-Yang Chen, Chih-Chung Tsai\",\"doi\":\"10.1109/ASSCC.2008.4708814\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-mum CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.\",\"PeriodicalId\":143173,\"journal\":{\"name\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE Asian Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASSCC.2008.4708814\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE Asian Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2008.4708814","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

提出了一种用于系统级静电放电(ESD)保护的片上瞬态-数字转换器。所提出的瞬态-数字转换器旨在检测系统级ESD事件期间的快速电瞬态。在系统级ESD测试中，输出的数字温度计代码可以对应不同的ESD电压。在3.3 v器件的0.18 μ m CMOS集成电路(IC)上的实验结果证实了该检测功能和数字输出代码。

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Transient-to-digital converter for ESD protection design in microelectronic systems

An on-chip transient-to-digital converter for system-level electrostatic discharge (ESD) protection is proposed. The proposed transient-to-digital converter is designed to detect fast electrical transients during the system-level ESD events. The output digital thermometer codes can correspond to different ESD voltages under system-level ESD tests. The experimental results in a 0.18-mum CMOS integrated circuit (IC) with 3.3-V devices have confirmed the detection function and digital output codes.

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2008 IEEE Asian Solid-State Circuits Conference

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