W. Davis, Robert J. Lavigna, D. L. Rehrig, Raymond E. Reusser, George Williams
{"title":"超大规模集成电路器件的硅晶体生长和外延层沉积","authors":"W. Davis, Robert J. Lavigna, D. L. Rehrig, Raymond E. Reusser, George Williams","doi":"10.1002/J.1538-7305.1986.TB00468.X","DOIUrl":null,"url":null,"abstract":"Silicon for microelectronic devices is prepared by a complex process that converts polycrystalline material into a single crystal ingot of silicon weighing as much as 40 kilograms. The crystal must conform to precise mechanical, electrical, chemical, and crystallographic standards. The crystal ingot is sliced into wafers which are polished and covered with an epitaxial layer having the same crystal structure as the wafer but different electrical properties. Understanding and controlling the growth processes involved in producing the single-crystal ingot and the epitaxial layer is crucial to manufacturing the high-quality starting material for today's very large scale integrated circuits.","PeriodicalId":170077,"journal":{"name":"AT&T Technical Journal","volume":"129 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Silicon crystal growth and epitaxial layer deposition for VLSI devices\",\"authors\":\"W. Davis, Robert J. Lavigna, D. L. Rehrig, Raymond E. Reusser, George Williams\",\"doi\":\"10.1002/J.1538-7305.1986.TB00468.X\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon for microelectronic devices is prepared by a complex process that converts polycrystalline material into a single crystal ingot of silicon weighing as much as 40 kilograms. The crystal must conform to precise mechanical, electrical, chemical, and crystallographic standards. The crystal ingot is sliced into wafers which are polished and covered with an epitaxial layer having the same crystal structure as the wafer but different electrical properties. Understanding and controlling the growth processes involved in producing the single-crystal ingot and the epitaxial layer is crucial to manufacturing the high-quality starting material for today's very large scale integrated circuits.\",\"PeriodicalId\":170077,\"journal\":{\"name\":\"AT&T Technical Journal\",\"volume\":\"129 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-07-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AT&T Technical Journal\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1002/J.1538-7305.1986.TB00468.X\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AT&T Technical Journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1002/J.1538-7305.1986.TB00468.X","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Silicon crystal growth and epitaxial layer deposition for VLSI devices
Silicon for microelectronic devices is prepared by a complex process that converts polycrystalline material into a single crystal ingot of silicon weighing as much as 40 kilograms. The crystal must conform to precise mechanical, electrical, chemical, and crystallographic standards. The crystal ingot is sliced into wafers which are polished and covered with an epitaxial layer having the same crystal structure as the wafer but different electrical properties. Understanding and controlling the growth processes involved in producing the single-crystal ingot and the epitaxial layer is crucial to manufacturing the high-quality starting material for today's very large scale integrated circuits.