Shalini Venkatesh, Marshall Tomas Depue, Hiroaki Okano, Hisato Uetsuka
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Insertion loss reduction by optimization of waveguide perturbations
We describe a method to significantly decrease insertion loss in waveguide-based devices, including optical cross-connects. Reductions as large as 3 dB are obtained in 32/spl times/32 switches by optimizing the dielectric perturbations.
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