{"title":"基于参数变化线性化宏模型的快速LDO仿真","authors":"T. Bradde, S. Grivet-Talocia","doi":"10.1109/EPEPS53828.2022.9947151","DOIUrl":null,"url":null,"abstract":"An approach for generating time-varying linearized macromodels of analog circuit blocks is presented. These models can be used to perform fast small-signal analyses characterized by nonstationary operating conditions, thanks to their certified stability. We validate the proposed approach by performing post-layout simulations of a Low DropOut (LDO) voltage regulator, in view of power integrity assessment applications.","PeriodicalId":284818,"journal":{"name":"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fast LDO Simulations via Parameter-Varying Linearized Macromodels\",\"authors\":\"T. Bradde, S. Grivet-Talocia\",\"doi\":\"10.1109/EPEPS53828.2022.9947151\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An approach for generating time-varying linearized macromodels of analog circuit blocks is presented. These models can be used to perform fast small-signal analyses characterized by nonstationary operating conditions, thanks to their certified stability. We validate the proposed approach by performing post-layout simulations of a Low DropOut (LDO) voltage regulator, in view of power integrity assessment applications.\",\"PeriodicalId\":284818,\"journal\":{\"name\":\"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS53828.2022.9947151\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS53828.2022.9947151","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fast LDO Simulations via Parameter-Varying Linearized Macromodels
An approach for generating time-varying linearized macromodels of analog circuit blocks is presented. These models can be used to perform fast small-signal analyses characterized by nonstationary operating conditions, thanks to their certified stability. We validate the proposed approach by performing post-layout simulations of a Low DropOut (LDO) voltage regulator, in view of power integrity assessment applications.
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