针对光学和物理IC背后攻击的可扩展和全面弹性概念

N. Herfurth, E. Amini, M. Lisker, Jean-Pierre Seifert, C. Boit
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引用次数: 1

摘要

只有芯片背面得到充分保护,才能保证IC的安全性。本文提出了一种全面且兼容vlsi的保护结构,以保护集成电路(IC)免受通过芯片背面针对IC的各种物理和光学攻击。通过将保护方案外包到专用保护晶圆上,提供了保护IC结构的新方法。然后,该保护晶圆不可逆地连接到IC上。该过程可以在晶圆级执行,实现与vlsi兼容的保护方案。并对基于该方法的集成实例进行了详细的描述和讨论。该保护晶片由形成光学不透明层的高掺杂硅衬底组成。保护晶圆不可逆地连接到集成电路上,并通过硅过孔(tsv)进行电接触。通过光电工艺验证了晶圆堆的完整性。保护晶片包含几个光子发射器件。在被保护IC的电路侧的几个pn结检测由保护晶片上的光子发射器件产生的光信号。
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A scalable & comprehensive resilience concept against optical & physical IC backside attacks
IC security is not ensured until the chip backside is fully protected. This paper presents a comprehensive and VLSI-compatible protection structure to secure integrated circuits (ICs) against all types of physical and optical attacks targeting the IC via the chip backside. The novel method of protecting the IC structure is provided by outsourcing the protection scheme onto a dedicated protection wafer. This protection wafer is then irreversibly bonded to the IC. This process can be performed at wafer level, realising a VLSI-compatible protection scheme. An example integration based on the new approach is described and discussed in detail.The protection wafer consists of a highly doped silicon substrate forming an optical opaque layer. The protection wafer is irreversibly bonded to the IC and electrically contacted by through silicon vias (TSVs). Integrity of the wafer-stack is verified by an electro-optical process. The protection wafer contains several photon-emitting devices. Several p-n junctions on the circuit side of the protected IC sense the optical signals generated by the photon emitting devices on the protection wafer.
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