Review of Highlight Suppression Methods for Structured Light 3D Measurement

Structured light 3D measurement technology undergoes continuous development and perfection since its appearance. Today, it has become a relatively mature technology widely used in various fields. However, there are still some problems to be solved in the development of structured light 3D measurement technology. In particular, the effect of highlight on the measurement results when measuring specularly reflective objects gets more and more noticeable. The specular reflection-induced highlight is one of the difficulties in 3D measurement of structured light, and the existing technology is unable to meet the requirements of increasingly complex and precise measurement work. This paper summarizes the domestic and foreign representative research results on highlight suppression methods based on structured light 3D measurement, which can be divided into three categories: software-based suppression method, hardware-based suppression method, and software-hardware combined suppression method.