Bayesian probabilistic model for life prediction and fault mode classification of solid state luminaires

A new method has been developed for assessment of the onset of degradation in solid state luminaires to classify failure mechanisms by using metrics beyond lumen degradation that are currently used for identification of failure. Luminous Flux output, Correlated Color Temperature Data on Philips LED Lamps has been gathered under 85°C/85%RH till lamp failure. Failure modes of the test population of the lamps have been studied to understand the failure mechanisms in 85°C/85%RH accelerated test. Results indicate that the dominant failure mechanism is the discoloration of the LED encapsulant inside the lamps which is the likely cause for the luminous flux degradation and the color shift. The acquired data has been used in conjunction with Bayesian Probabilistic Models to identify luminaires with onset of degradation much prior to failure through identification of decision boundaries between lamps with accrued damage and lamps beyond the failure threshold in the feature space. In addition luminaires with different failure modes have been classified separately from healthy pristine luminaires. The α-λ plots have been used to evaluate the robustness of the proposed methodology. Results show that the predicted degradation for the lamps tracks the true degradation observed during 85°C/85%RH during accelerated life test fairly closely within the ±20% confidence bounds. Correlation of model prediction with experimental results indicates that the presented methodology allows the early identification of the onset of failure much prior to development of complete failure distributions and can be used for assessing the damage state of SSLs in fairly large deployments. It is expected that, the new prediction technique will allow the development of failure distributions without testing till L70 life for the manifestation of failure.