{"title":"自动化测量的软件技术","authors":"J.J. Truchard","doi":"10.1109/IMTC.1989.36865","DOIUrl":null,"url":null,"abstract":"The author describes three different personal-computer-based approaches to the software support of measurement applications. The first approach is for skilled programmers who want very flexible tools in a wide variety of programming languages. The second adds programming productivity tools to eliminate much of the detailed programming. The third and most advanced software system attempts to eliminate instrumentation programming entirely with a highly graphical environment.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Software technology for automated measurements\",\"authors\":\"J.J. Truchard\",\"doi\":\"10.1109/IMTC.1989.36865\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author describes three different personal-computer-based approaches to the software support of measurement applications. The first approach is for skilled programmers who want very flexible tools in a wide variety of programming languages. The second adds programming productivity tools to eliminate much of the detailed programming. The third and most advanced software system attempts to eliminate instrumentation programming entirely with a highly graphical environment.<<ETX>>\",\"PeriodicalId\":298343,\"journal\":{\"name\":\"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1989.36865\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1989.36865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The author describes three different personal-computer-based approaches to the software support of measurement applications. The first approach is for skilled programmers who want very flexible tools in a wide variety of programming languages. The second adds programming productivity tools to eliminate much of the detailed programming. The third and most advanced software system attempts to eliminate instrumentation programming entirely with a highly graphical environment.<>
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