正直流流光和脉冲电晕放电下等离子体-水界面过氧化氢的形成

Y. Zhao, Tao Wang, S. Macgregor, Mark P. Wilson, I. Timoshkin
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引用次数: 0

摘要

等离子体诱导的高级氧化过程(AOPs)因其能够产生H2O2和OH自由基[3]等活性物质而被广泛研究[1,2]。采用针脚-水电极系统研究了等离子体-水界面的反应机理,在静态和流动条件下,水作为接地电极。采用草酸钛钾分光光度法定量测定水中H2O2的生成。叔丁醇作为OH自由基清除剂,阻止OH自由基二聚化成H2O2。
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Hydrogen Peroxide Formation at Plasma-water Interface under Positive Dc Streamer and Pulsed Corona Discharge
Plasma-induced advanced oxidation processes (AOPs) have been widely investigated [1, 2] due to its ability to generate reactive species such as H2O2 and OH radicals [3]. A pin-towater electrode system was employed to investigate the reaction mechanisms at the plasma-water interface, with water used as the ground electrode under both static and flowing conditions. The formation of H2O2 in water was quantified by the spectrophotometric method, using potassium titanium (IV) oxalate. Tert-butanol was used as an OH radical scavenger, to stop the dimerization of OH radicals into H2O2.
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