{"title":"高性能组件软件改变ATE配置规则","authors":"P. Stern","doi":"10.1109/AUTEST.1997.633593","DOIUrl":null,"url":null,"abstract":"New component technology, made possible by wide acceptance of the VXIplug&play standard, allows ATE buyers to select test system components in much the same way they choose stereo system components. This paper will examine the uses and benefits of component software technology in three different ATE configuration scenarios: updating legacy ATE, integrating component test equipment into larger ATE, and configuring specialized test equipment (STE) for custom requirements. Several possibilities for leveraging new component technology such as high-performance test executives and diagnostic tools are discussed to illustrate the flexibility users will soon have in configuring ATE.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High-performance component software changes the rules for configuring ATE\",\"authors\":\"P. Stern\",\"doi\":\"10.1109/AUTEST.1997.633593\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"New component technology, made possible by wide acceptance of the VXIplug&play standard, allows ATE buyers to select test system components in much the same way they choose stereo system components. This paper will examine the uses and benefits of component software technology in three different ATE configuration scenarios: updating legacy ATE, integrating component test equipment into larger ATE, and configuring specialized test equipment (STE) for custom requirements. Several possibilities for leveraging new component technology such as high-performance test executives and diagnostic tools are discussed to illustrate the flexibility users will soon have in configuring ATE.\",\"PeriodicalId\":369132,\"journal\":{\"name\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1997.633593\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High-performance component software changes the rules for configuring ATE
New component technology, made possible by wide acceptance of the VXIplug&play standard, allows ATE buyers to select test system components in much the same way they choose stereo system components. This paper will examine the uses and benefits of component software technology in three different ATE configuration scenarios: updating legacy ATE, integrating component test equipment into larger ATE, and configuring specialized test equipment (STE) for custom requirements. Several possibilities for leveraging new component technology such as high-performance test executives and diagnostic tools are discussed to illustrate the flexibility users will soon have in configuring ATE.
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