{"title":"一种结合断续电弧故障技术的方法","authors":"C. Parkey, C. Hughes, M. Caulfield, M. Masquelier","doi":"10.1109/AUTEST.2012.6334571","DOIUrl":null,"url":null,"abstract":"Intermittent wire faults can be caused by harsh environments, handling or simply aging of the sheathing. These types of faults are difficult to isolate due to the intermittent nature. Recent advances in intermittent fault detection have provided the aerospace and defense industry new methods to test aging aircraft wiring. In particular the use of Low Energy High Voltage (LEHV) methods and Spread Spectrum Time Domain Reflectometry (SSTDR) has shown promise in locating intermittent faults in a variety of situations. These technologies have distinct advantages which best serve the industry in a combined package. This paper presents a novel method of combining these technologies in a portable fashion to solve the growing need for intermittent fault detection.","PeriodicalId":142978,"journal":{"name":"2012 IEEE AUTOTESTCON Proceedings","volume":"2006 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A method of combining intermittent arc fault technologies\",\"authors\":\"C. Parkey, C. Hughes, M. Caulfield, M. Masquelier\",\"doi\":\"10.1109/AUTEST.2012.6334571\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Intermittent wire faults can be caused by harsh environments, handling or simply aging of the sheathing. These types of faults are difficult to isolate due to the intermittent nature. Recent advances in intermittent fault detection have provided the aerospace and defense industry new methods to test aging aircraft wiring. In particular the use of Low Energy High Voltage (LEHV) methods and Spread Spectrum Time Domain Reflectometry (SSTDR) has shown promise in locating intermittent faults in a variety of situations. These technologies have distinct advantages which best serve the industry in a combined package. This paper presents a novel method of combining these technologies in a portable fashion to solve the growing need for intermittent fault detection.\",\"PeriodicalId\":142978,\"journal\":{\"name\":\"2012 IEEE AUTOTESTCON Proceedings\",\"volume\":\"2006 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE AUTOTESTCON Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2012.6334571\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE AUTOTESTCON Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2012.6334571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A method of combining intermittent arc fault technologies
Intermittent wire faults can be caused by harsh environments, handling or simply aging of the sheathing. These types of faults are difficult to isolate due to the intermittent nature. Recent advances in intermittent fault detection have provided the aerospace and defense industry new methods to test aging aircraft wiring. In particular the use of Low Energy High Voltage (LEHV) methods and Spread Spectrum Time Domain Reflectometry (SSTDR) has shown promise in locating intermittent faults in a variety of situations. These technologies have distinct advantages which best serve the industry in a combined package. This paper presents a novel method of combining these technologies in a portable fashion to solve the growing need for intermittent fault detection.
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