经过验证的高可靠性VDSM单通道设计方法

Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434) Pub Date : 1900-01-01 DOI:10.1109/APASIC.2000.896959

Keun-Ok Seo, Sancho Park

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摘要

本文讨论了Avant!在最近的极深亚微米(VDSM)时代，硅证明了单通道设计方法。先锋派的!单通过程是一个可预测和可控的设计过程，不仅考虑时序，而且考虑信号/功率完整性。通过将正确的技术应用于设计问题的根本原因，这个过程可以在最短的时间内产生最佳结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proven single pass design methodology for high reliable VDSM

This paper addresses the Avant! silicon proven single pass design methodology for the recent very deep submicron (VDSM) era. Avant!'s single pass process is a predictable and controllable design process with closure in mind, not only for timing but also for signal/power integrity. By applying the right technology to the root cause of a design problem, this process can generate an optimal result in the shortest time.

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Proceedings of Second IEEE Asia Pacific Conference on ASICs. AP-ASIC 2000 (Cat. No.00EX434)

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