锁相环中的混沌

2006 International Symposium on VLSI Design, Automation and Test Pub Date : 2006-04-26 DOI:10.1109/VDAT.2006.258110

Ping-Ying Wang

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引用次数: 9

摘要

证明了锁相环中混沌的存在性。本文首次报道了数字电荷泵锁相环中的边界碰撞分岔和混沌现象。给出了行为模型的数值结果，解释了锁相环中存在混沌现象的原因。此外，我们强调在一般的样本保持反馈电路中也会存在相同的混沌现象

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Chaos In Phase Locked Loop

We prove existence of chaos in phase locked loop (PLL). It is the first time that border-collision bifurcations and chaotic phenomenon in digital charge pump PLL is reported. The numerical result of behavior model is also presented to explain why the chaotic phenomenon exists in PLL. Moreover we highlight that the same chaotic phenomenon will exist in general sample hold feedback circuits

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2006 International Symposium on VLSI Design, Automation and Test

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