Jae-cheol Bae, Jooho Kim, I. Hwang, Hyunki Kim, Jin-kyung Lee, HyunSoo Park, Insik Park, J. Tominaga
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Error Rate Improvement of 75 nm Super-RENS Signal in 405nm, 0.85 NA System
We report the error rate improvement of super-resolution near field structure (Super-RENS) write-once read-many (WORM) disk at a blue laser optical system. (Laser wavelength 405 nm, numerical aperture 0.85) We used a disk of which carrier level of 75 nm is improved. We controlled the equalization (EQ) characteristics and used the adaptive write strategy and advanced partial-response maximum likelihood (PRML) technique. We obtained bit error rate (BER) of 10-4 level with new signal processing techniques. This result shows high feasibility of super-RENS technology for practical use
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