【无创测量牙本质阻力至预备深度极限的方法】。

Deutsche zahnarztliche Zeitschrift Pub Date : 1991-11-01
M Gente, H J Wenz
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引用次数: 0

摘要

电阻测量可用于确定牙冠修复准备的牙髓角尖的情况。这些最小牙本质厚度的位置所记录的电阻值取决于牙本质层的厚度和牙齿发育的程度。当电阻值为25 k ω时,牙本质厚度为0.7-1.45 mm。年轻患者的牙本质层较老年患者厚。
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[Non-invasive method of measuring dentin resistance to the limit of the preparation depth].

Electrical resistance measurements may be used to determine the situation of the pulp horn tips of teeth prepared for crown restorations. The resistance value recorded for these sites of minimum dentin thickness depends on the thickness of the dentin layer and the degree of tooth development. A resistance value of 25 k omega revealed dentin thickness of 0.7-1.45 mm. The teeth of younger patients had thicker dentin layers than those of older patients.

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