保护导线系数 k2 的分析评估

Massimo Mitolo, M. Tartaglia
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引用次数: 7

摘要

发生相间接地故障时,由于焦耳效应,在保护装置动作的清零时间内会产生异常水平的热能 I2t。I2t 也称为比能量或焦耳积分,积聚在形成故障回路的元件内,如负责将接地故障电流返回源的保护导体(也称为设备接地导体)。因此,这些导体的温度会升高,如果设计不当,可能会超过其绝缘层所能承受的最大值。这种危险情况会导致导体绝缘失效和/或引发邻近材料起火。因此,保护导体所能承受的最大 I2t 值对于确保电气安全至关重要。最大 I2t 所依赖的参数由系数 k2 描述,本文将对其进行讨论和分析评估。作者的目的是为技术书籍协调委员会 IEEE P3003.2 "工业和商业电力系统设备接地和接合推荐实践 "的电力系统接地工作组提供理论支持;该工作组目前正在根据 IEEE 标准 142-2007(也称为 "绿皮书")制定一个点状标准。为此,工作组还将对目前存在于国际电工委员会 (IEC) 和电气和电子工程师学会 (IEEE) 的规范、标准以及文献中的现有公式进行比较。
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An analytical evaluation of the factor k2 for protective conductors
At the occurrence of phase-to-ground faults, abnormal levels of thermal energy I2t, due to the Joule effect, will be developed during the clearing time that protective devices take to operate. The I2t, also referred to as specific energy or Joule Integral, is accumulated within the elements forming the fault-loop, such as the protective conductors (also referred to as equipment grounding conductors), responsible to return ground-fault currents to the source. As a consequence, the temperature of these conductors elevates and may exceed, in the case of an incorrect design, the maximum value that their insulation can withstand. This dangerous situation can cause the failure of the conductor insulation and/or trigger fires in neighboring materials. The maximum I2t that protective conductors can endure is, therefore, crucial in order to guarantee the electrical safety. The parameters on which the maximum I2t depends are described by the factor k2, which will be herein discussed and analytically evaluated. The intention of the authors is to provide a theoretical support to the Power Systems Grounding Working Group of the Technical Books Coordinating Committee IEEE P3003.2 “Recommended Practice for Equipment Grounding and Bonding in Industrial and Commercial Power Systems”; the working group is currently elaborating a dot standard based on the IEEE standard 142-2007, also referred to as the Green Book. To this purpose, a comparison with existing formulae, currently present in codes, standards of the International Electrotechnical Commission (IEC) and of the IEEE, as well as in literature, will be also presented.
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