具有深亚波长表面粗糙度的等离子体薄膜的光学成像

NAECON 2014 - IEEE National Aerospace and Electronics Conference Pub Date : 2014-06-24 DOI:10.1109/NAECON.2014.7045772

L. Tsang, K. Ding, P. Duvelle, J. Vella, J. Goldsmith, C. Devlin, N. Limberopoulos

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引用次数: 0

摘要

报道了一层等离子体薄膜的亚波长成像。本文研究了亚波长表面粗糙度对亚衍射极限成像的增强作用。基于线性化散射势的Lippmann Schwinger方程进行了全波模拟。并报道了实验进展。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Optical imaging over a plasmonic thin film with deep-subwavelength surface roughness

Subwavelength imaging has been reported for a layer of plasmonic thin film. In this paper, we investigate the enhancement of the sub-diffraction-limit imaging using subwavelength surface roughness. Full wave simulations are carried out based on Lippmann Schwinger equation with linearized scattering potentials. Progresses in experiment are also reported.

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NAECON 2014 - IEEE National Aerospace and Electronics Conference

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