微波场处理材料过热区控制中的热像校正

V. F. Kim, L. Plavsky, A. I. Rodionov
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引用次数: 0

摘要

要测定微波场中磷酸碳剂的闪点,要求加工材料的整个表面温度不超过68°C。给出了利用一个认证热场和两个非认证热场对几何噪声进行校正的方法。这些方法硬件表示简单,可用于实时校正热视图,即直接在热视设备活动期间。
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The thermal image correction in control of overheated zones of materials handled by microwave field
To determine the flash point of carbon-phosphate agent in microwave fields at processing is required to be not exceeded temperature 68 °C over the entire surface of the material being processed. The methods of correction of geometric noise with usage of one certificated thermal field and two not certificated fields are offered. These methods are simple for hardware representation and may be utilised for correction of thermovision map in real time, that is, directly during activity of thermovision device.
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