金属材料PIM评价的短路传输线法

Y. Yamamoto, N. Kuga
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引用次数: 15

摘要

提出了一种用于金属材料PIM评价的短路传输线法。这种方法完全不受阻抗匹配的限制,并且有利于避免低噪声终止问题。这使得可以将任意形状的样品作为点PIM源,并在适当的电流密度条件下对其进行评估。此外,驻波的电流反节点位于样品放大观察到的PIM性质。与使用端接传输线的传统方法相比,这些特性提高了低电平PIM测量的分辨率和稳定性。利用导线和铜箔在2ghz频段进行了实验,验证了该方法的有效性。以短路导线的形式对样品进行评估,以便准确地估计样品上的电流密度。对铜箔的PIM特性进行了研究,结果表明,不同铜箔之间的微小差异可以被清晰地检测出来。
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A short-circuit transmission line method for PIM evaluation of metallic materials
A short-circuit transmission line method for PIM evaluation of metallic materials is proposed in this paper. This method has no restriction of impedance matching at all, and is advantageously free from the low noise termination problem. This enables to treat arbitrarily-shaped samples as a point PIM source, and evaluate them in appropriate current density condition. In addition, the current anti-node of a standing wave located on a sample magnifies observed PIM property. These features improve the resolution and stability in low-level PIM measurement compared for the conventional method using terminated transmission line. Validity of the proposed method is confirmed by the experiments using wires and copper foils in 2 GHz. The sample is evaluated in the form of a shorting wire so that the current density on sample is estimated exactly. PIM characteristics of copper foils are also investigated, which indicates that small differences among the foils are detected clearly.
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