{"title":"与纵向非均匀波导有关的正反问题的近似","authors":"A. Aydoğan, F. Akleman","doi":"10.1109/ISFEE.2016.7803186","DOIUrl":null,"url":null,"abstract":"An approximation is derived for longitudinally inhomogeneous waveguides (LIW). Total reflections are adopted for a rough approximation through the tracking of the main reflected and transmitted fields in the multilayered dielectric structure. This approximation can be used to determine the thickness of layers of which the dielectric properties are known. Although the obtained thickness values are a rough approximation for the exact values, they provide a utility for iterative optimization algorithms for which the initial values are vital.","PeriodicalId":240170,"journal":{"name":"2016 International Symposium on Fundamentals of Electrical Engineering (ISFEE)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An approximation for direct and inverse problems related to longitudinally inhomogeneous waveguides\",\"authors\":\"A. Aydoğan, F. Akleman\",\"doi\":\"10.1109/ISFEE.2016.7803186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An approximation is derived for longitudinally inhomogeneous waveguides (LIW). Total reflections are adopted for a rough approximation through the tracking of the main reflected and transmitted fields in the multilayered dielectric structure. This approximation can be used to determine the thickness of layers of which the dielectric properties are known. Although the obtained thickness values are a rough approximation for the exact values, they provide a utility for iterative optimization algorithms for which the initial values are vital.\",\"PeriodicalId\":240170,\"journal\":{\"name\":\"2016 International Symposium on Fundamentals of Electrical Engineering (ISFEE)\",\"volume\":\"99 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Symposium on Fundamentals of Electrical Engineering (ISFEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISFEE.2016.7803186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Symposium on Fundamentals of Electrical Engineering (ISFEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISFEE.2016.7803186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An approximation for direct and inverse problems related to longitudinally inhomogeneous waveguides
An approximation is derived for longitudinally inhomogeneous waveguides (LIW). Total reflections are adopted for a rough approximation through the tracking of the main reflected and transmitted fields in the multilayered dielectric structure. This approximation can be used to determine the thickness of layers of which the dielectric properties are known. Although the obtained thickness values are a rough approximation for the exact values, they provide a utility for iterative optimization algorithms for which the initial values are vital.
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