A delta-sigma modulation based BIST scheme for mixed-signal systems

We present the architecture and analysis of a built-in self-test (BIST) scheme that targets mixed-signal system-on-chip (SOC) designs. The basic idea is to employ simple yet high-tolerant digital-to-analog (DA) and analog-to-digital (AD) conversion techniques for on-chip stimulus generation and response acquisition, and to utilize on-chip programmable cores for digital signal processing required for signal synthesis and response analysis. Numerical simulations are conducted to validate the idea and the results demonstrate the effectiveness of this BIST scheme.