Synthesis and Characterization of Cerium Oxide Thin Films Fabricated via the Facile Doctor Blade Method

In this study, we present an in-depth investigation of cerium oxide (CeO2) thin films synthesized using the doctor blade approach, with polyethylene glycol employed as a binder. A comprehensive characterization employing X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), UV-visible spectroscopy, and atomic force microscopy (AFM) has been conducted to elucidate the structural, chemical, and morphological attributes of the fabricated films. The XRD analysis reveals distinctive wide diffraction peaks indicative of a face-centered cubic CeO2 crystalline structure existing in a singular phase. The morphological analysis using AFM delineates a mean square roughness of 34.54 nm, providing valuable insights into the surface topography of the CeO2 thin films. Additionally, the direct correlation between the material’s band gap, determined as 1.92 eV through UV-visible spectroscopy, and its nanostructural features is established using spectroscopic ellipsometry in conjunction with AFM studies. This approach offers a unique perspective on the optical characteristics of CeO2 films, enhancing our understanding of their nanostructures and facilitating the optimization of their performance for energy applications. Furthermore, the synergistic utilization of scanning electron microscopy (SEM) and spectroscopic ellipsometry contributes to a comprehensive understanding of the growth modes and surface characteristics of the thin films. The integration of these advanced techniques not only refines the fabrication process but also provides crucial insights into the intricate interplay between morphology and optical properties, crucial for optimizing thin films for various applications.