生长用于同步加速器高分辨率 X 射线成像的终极高密度闪烁膜

Q2 Engineering Optical Materials: X Pub Date : 2024-03-28 DOI:10.1016/j.omx.2024.100309
Laura Wollesen , Paul-Antoine Douissard , Philip Cook , Pavel Loiko , Gurvan Brasse , Jérémie Margueritat , Patrice Camy , Thierry Martin , Christophe Dujardin
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引用次数: 0

摘要

闪烁体是 X 射线到可见光的转换器,应用于同步加速器的 X 射线成像探测器。第四代同步辐射源的性能大幅提高,使我们能够在更高能量下进行 X 射线成像实验。高空间分辨率 X 射线成像(微米到亚微米)需要薄闪烁膜。因此,特别是在高 X 射线能量(30 千伏至 100 千伏)下,由于薄膜对 X 射线的吸收效率较低,探测效率受到限制。我们利用液相外延(LPE)技术生长出一种终极高密度材料--Lu2Hf2O7:Eu3+ 的薄膜,这种薄膜具有闪烁特性,因此兼具高空间分辨率和最大吸收效率。X 射线成像实验表明,在 900 lp/mm 时,调制传递函数(MTF)达到 10%,射线照片直观地证实了其良好的成像特性。我们介绍了在 ZrO2:Y 衬底上生长的 Lu2Hf2O7:Eu 薄膜的结构、发光和闪烁特性,结果表明薄膜在无序萤石结构中结晶,铕离子融入结构中并增强了发光强度。这项研究为开发前景广阔的基于铪酸盐的超致密闪烁屏、用于高空间分辨率 X 射线成像迈出了第一步。
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Growth of ultimate high-density scintillating films for high-resolution X-ray imaging at synchrotrons

Scintillators are X-ray to visible light converters applied in X-ray imaging detectors used at synchrotrons. Drastically improved performances of the 4th generation synchrotron sources enable us to perform X-ray imaging experiments at higher energies. For high spatial resolution X-ray imaging (micrometer to submicrometer), thin scintillating films are required. Consequently, especially for high X-ray energies (30 keV to 100 keV), the detection efficiency is limited due to the low X-ray absorption efficiency of the thin films. We have used Liquid Phase Epitaxy (LPE) to grow thin films of one of the ultimate high-density materials, Lu2Hf2O7:Eu3+, which demonstrate scintillating properties and thus combine high spatial resolution and maximized absorption efficiency. X-ray imaging experiments demonstrate that the Modulation Transfer Function (MTF) reaches 10% at 900 lp/mm, and radiographs visually confirm the promising imaging properties. We present structural, luminescent, and scintillation characterization of Lu2Hf2O7:Eu thin films grown on ZrO2:Y substrates, showing that the films crystallize in the disordered fluorite structure and the europium ions incorporate into the structure and enhance the luminescence intensity. This contribution is a first step toward developing promising ultra-dense, hafnate-based scintillating screens for high spatial resolution X-ray imaging.

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来源期刊
Optical Materials: X
Optical Materials: X Engineering-Electrical and Electronic Engineering
CiteScore
3.30
自引率
0.00%
发文量
73
审稿时长
91 days
期刊最新文献
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