Ravi Raj Purohit Purushottam Raj Purohit, D. Fowan, Stephan Arnaud, Nils Blanc, J. Micha, René Guinebretière, O. Castelnau
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引用次数: 0
摘要
X 射线 Laue 微衍射旨在以 10-4 ∼ 10-4 的应变分辨率在亚微米尺度上表征多晶试样的微观结构和机械场。本文介绍了一种新颖独特的 Laue 微衍射装置和配准程序,可在高达 1500 K 的温度下进行测量,目的是将该技术扩展到研究高温下发生的晶体相变和相关应变场演变。该方法提供了一种测量试样遇到的实际温度的方法,这对于精确的相变研究至关重要,同时还提供了一种使用标准 α 氧化铝单晶校准装置几何形状的策略,以考虑试样和熔炉的扩张。作为示例,我们提供了纯氧化锆多晶试样相变的首次应用。
Laue microdiffraction on polycrystalline samples above 1500 K achieved with the QMAX-µLaue furnace
X-ray Laue microdiffraction aims to characterize microstructural and mechanical fields in polycrystalline specimens at the sub-micrometre scale with a strain resolution of ∼10−4. Here, a new and unique Laue microdiffraction setup and alignment procedure is presented, allowing measurements at temperatures as high as 1500 K, with the objective to extend the technique for the study of crystalline phase transitions and associated strain-field evolution that occur at high temperatures. A method is provided to measure the real temperature encountered by the specimen, which can be critical for precise phase-transition studies, as well as a strategy to calibrate the setup geometry to account for the sample and furnace dilation using a standard α-alumina single crystal. A first application to phase transitions in a polycrystalline specimen of pure zirconia is provided as an illustrative example.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.