(特邀)近场光学及其在纳米材料中的应用:综述

Giovanni Fanchini, Noah B. Stocek, Victor Wong
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引用次数: 0

摘要

在本文中,我们首先概述了孔径型扫描近场光学显微镜--基于蒸发波的超分辨成像技术系列,它可以与原子力显微镜相结合,能够进行亚波长分辨率的纳米光学成像。在本综述的第二部分,我们将讨论一些应用,在这些应用中,我们的研究小组利用 SNOM 的超分辨率分辨能力设计了特定的纳米光学和纳米光子系统,用于光收集、电阻式存储器件应用和纳米级热光管理。将介绍的具体案例研究包括用于存储器件应用的弱光致发光和弯曲碳点的表征、等离子体增强纳米光子器件的三维表征,以及用于基于纳米光子的热管理应用的近场热反射成像的开发。总之,我们的研究充分体现了 SNOM 作为一种独特的超分辨率纳米光子工具在纳米尺度光-物质相互作用研究中的通用性。
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(Invited) Near-Field Optics and Its Applications in Nanoscale Materials: A Review
In this paper, we first offer an overview of aperture-type scanning near field optical microscopy –a family of super-resolution imaging techniques based on evanescent waves, which can be combined with atomic force microscopy and are capable of subwavelength resolution nano-optical imaging. In the second part of this review, we will discuss a few applications in which our group capitalized on the super-resolution resolving power of SNOM to design specific nano-optical and nano-photonic systems for light harvesting, resistive memory device applications and nanoscale thermo-optical management. Specific case studies that will be presented include the characterization of weakly photoluminescent and curved carbon dots for memory device applications, the three-dimensional characterization of plasmon-enhanced nanophotonic devices, as well as the development of near-field thermoreflectance imaging for nanophotonic-based thermal management applications. Collectively, our study well represents the versability of SNOM as a unique super-resolution nanophotonic tool for the investigation of light-matter interaction at the nanoscale.
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