用于非氧化物陶瓷沉积的两步式 ALD 工艺:氮化硼实例

Ali Hossain, Thomas Souvignet, Neil Richard Innis, Wenjun Hao, Olivier Boisron, Ileana Florea, Peng Xiao, M. Sledzinska, Catherine Journet, C. Marichy
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摘要

基于聚合物衍生陶瓷(PDCs)化学的原子层沉积(ALD)技术可用于制造由三氯硼嗪和六甲基二硅氮烷反应生成的氮化硼薄膜。将 PDCs 路线移植到 ALD 非常适合沉积陶瓷,尤其是非氧化物陶瓷,因为它提供了各种分子前体。通过 ALD 工艺形成所谓的预陶瓷膜和随后的陶瓷化两步法,在各种无机基底上成功合成了保形和均匀的 BN 层。在第一阶段,可在低至 90 °C 的温度下获得光滑的聚硼嗪涂层。验证了 ALD 气体-表面反应的饱和性和自限性。有趣的是,似乎存在三个 ALD 窗口,这归因于配体交换的变化。在使用热处理进行陶瓷化阶段后,获得了保形的近全度 BN 层。通过控制处理温度,它们的结晶度结构可从无定形调整为结晶良好的 sp² 相。特别是在 1000°C 时开始结晶,1350°C 陶瓷化后,可观察到与表面平行的清晰的 sp² 晶面。最后,热处理引起的基底表面侧改性似乎会对最终的 BN 形貌和缺陷生成产生影响。
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Two-step ALD process for non-oxide ceramic deposition: the example of boron nitride
Atomic layer deposition (ALD) based on polymer-derived ceramics (PDCs) chemistry is used for the fabrication of boron nitride thin films from reaction between trichloroborazine and hexamethyldisilazane. The transposition of the PDCs route to ALD is highly appealing for depositing ceramics, especially non-oxide ones, as it offers various molecular precursors. From a two-step approach composed of an ALD process forming a so-called preceramic film and its subsequent ceramization, conformal and homogenous BN layers are successfully synthesized on various inorganic substrates. In the first stage, smooth polyborazine coatings are obtained at a temperature as low as 90 °C. The saturation and self-limitation of the ALD gas-surface reactions are verified. Intriguingly, three ALD windows seem to exist and are attributed to change in ligand exchange. After the ceramization stage using a heat treatment, conformal near-stoichiometric BN layers are obtained. Their structure in terms of crystallinity can be adjusted from amorphous to well-crystalline sp² phase by controlling the treatment temperature. In particular, a crystallization onset occurs at 1000 °C and well defined sp² crystalline planes oriented parallel to the surface are noted after ceramization at 1350°C. Finally, side-modification of the substrate surface induced by the thermal treatment appears to impact on the final BN topography and defect generation.
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