对具有辐射环境的光子晶体板中的拓扑结构进行分类

Stephan Wong, Terry A. Loring, Alexander Cerjan
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引用次数: 0

摘要

近年来,光子奇恩材料引起了人们的极大兴趣,因为它们具有拓扑边缘态,能够抵御无序状态,有望实现与缺陷无关的集成光子晶体板设备。然而,这些光子Chern板中的面外辐射损耗以前一直被忽视,导致对这些系统的拓扑保护预测精度有限。在此,我们开发了一个通用框架,用于测量光子系统(如光子晶体板)中的拓扑保护,同时考虑面内和面外辐射损耗。我们的方法依赖于光谱定位器,它将系统的位置矩阵和哈密顿矩阵结合起来,绘制出系统拓扑结构的真实图像。这种基于算子的拓扑方法允许我们在通过有限元法(FEM)进行离散化之后,使用直接从全波麦克斯韦方程中导出的有效哈密顿,从而全面解释系统的所有物理过程。由于频谱有限元定位器完全由系统主方程的有限元离散化构建而成,因此所提出的框架适用于任何物理系统,并与常用的有限元软件兼容。展望未来,我们预计该方法的通用性将有助于对各种复杂物理系统进行拓扑分类。
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Classifying topology in photonic crystal slabs with radiative environments
In the recent years, photonic Chern materials have attracted substantial interest as they feature topological edge states that are robust against disorder, promising to realize defect-agnostic integrated photonic crystal slab devices. However, the out-of-plane radiative losses in those photonic Chern slabs has been previously neglected, yielding limited accuracy for predictions of these systems’ topological protection. Here, we develop a general framework for measuring the topological protection in photonic systems, such as in photonic crystal slabs, while accounting for in-plane and out-of-plane radiative losses. Our approach relies on the spectral localizer that combines the position and Hamiltonian matrices of the system to draw a real-picture of the system’s topology. This operator-based approach to topology allows us to use an effective Hamiltonian directly derived from the full-wave Maxwell equations after discretization via finite-elements method (FEM), resulting in the full account of all the system’s physical processes. As the spectral FEM-localizer is constructed solely from FEM discretization of the system’s master equation, the proposed framework is applicable to any physical system and is compatible with commonly used FEM software. Moving forward, we anticipate the generality of the method to aid in the topological classification of a broad range of complex physical systems.
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