缺陷和空位工程改善了掺杂/退火 Sm 的 BaCo2Fe16O27 复合材料的微波吸收能力

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-08-14 DOI:10.1007/s11664-024-11351-y
Haoqi Dong, Zhiqiang Yun, Ganhong Zheng, Wei Ding, Zhenxiang Dai, Chuhong Zhu, Meiling Wang
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引用次数: 0

摘要

缺陷和缺陷技术被认为是提高电磁波(EMW)吸收性能的有效方法。本研究采用简单的球磨和退火工艺合成了掺杂 Sm 的 W 型六价钡铁氧体 BaCo2Fe16O27(BCFO)复合材料。系统研究了 BCFO 复合材料的相结构特征、磁性能和微波吸收性能。具体来说,由于理想阻抗匹配和大介质损耗之间的有效相互作用,掺杂Sm并经过退火处理的BCFO复合材料表现出了出色的微波吸收特性,特别是在8.5 GHz频率下,厚度为3 mm的复合材料的最小反射损耗(RL)值为-28.57 dB。此外,有效吸收带宽达到 11 GHz,覆盖了 7-18 GHz 的范围。研究认为,在氩气氛中掺杂或退火产生的Sm缺陷和空位可能是增强微波吸收的有效手段,并详细讨论了相关机制。
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Defect and Vacancy Engineering Improved Microwave Absorption in a BaCo2Fe16O27 Composite with Sm Doping/Annealing

Defects and defective technology are considered to be an efficient method for improving electromagnetic wave (EMW) absorption performance. In this study, W-type barium hexaferrite BaCo2Fe16O27 (BCFO) composites with Sm doping were synthesized by a simple ball milling and subsequent annealing process. The phase structure characteristics, magnetic properties, and microwave absorption performance of the BCFO composites were systematically investigated. Specifically, Sm-doped and annealed BCFO composites demonstrated outstanding microwave absorption characteristics because of the efficient interaction between ideal impedance matching and large dielectric loss, specifically, a minimum reflection loss (RL) value of −28.57 dB at 8.5 GHz with 3 mm thickness. Moreover, a broad effective absorption bandwidth reaches 11 GHz, covering the range of 7–18 GHz. It is believed that defects and vacancies induced by Sm doping or annealing in the Ar atmosphere may be an effective means for enhancing microwave absorption, and related mechanisms are discussed in detail.

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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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