利用深度学习在流程挖掘中进行预测性监控，以提供更好的消费者服务

{"title":"利用深度学习在流程挖掘中进行预测性监控，以提供更好的消费者服务","authors":"Vasanth Yarlagadda, Abishi Chowdhury, Amrit Pal, Shruti Mishra, Sandeep Kumar Satapathy, Sung Bae Cho, Sachi Nandan Mohanty, Ashit Kumar Dutta","doi":"10.1109/tce.2024.3456677","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13208,"journal":{"name":"IEEE Transactions on Consumer Electronics","volume":"20 1","pages":""},"PeriodicalIF":4.3000,"publicationDate":"2024-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Predictive Monitoring in Process Mining Using Deep Learning for Better Consumer Service\",\"authors\":\"Vasanth Yarlagadda, Abishi Chowdhury, Amrit Pal, Shruti Mishra, Sandeep Kumar Satapathy, Sung Bae Cho, Sachi Nandan Mohanty, Ashit Kumar Dutta\",\"doi\":\"10.1109/tce.2024.3456677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13208,\"journal\":{\"name\":\"IEEE Transactions on Consumer Electronics\",\"volume\":\"20 1\",\"pages\":\"\"},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Consumer Electronics\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/tce.2024.3456677\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Consumer Electronics","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/tce.2024.3456677","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}