分子动力学研究超声波振动方向、振幅和频率对蓝宝石抛光的影响

Wenhu Xu , Cheng Huang , Xianghong Liu , Min Zhong , Jianfeng Chen , Meirong Yi , Xiaobing Li
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引用次数: 0

摘要

通过分子动力学(MD)研究了不同超声波方向、频率和振幅下的蓝宝石表面形貌、原子去除率、温度、抛光力、表面下损伤、位错和应力。对于垂直和水平振动,超声波频率和振幅的升高会降低切向力和法向力,提高次表面温度和材料去除率(MRR)。较高的频率可促进基底位错,从而减少次表层损伤。在水平振动下,振幅越大,次表层损伤层越薄。但在垂直振动下情况则相反。水平振动由于轨迹较长,对蓝宝石表面的影响较小,因此可获得较平整的抛光表面和较薄的表下损伤层。这项研究可为蓝宝石的高质量抛光提供参考。
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Influences of ultrasonic vibration directions, amplitudes, and frequencies on sapphire polishing studied by molecular dynamics

The sapphire surface morphology, atom removal rate, temperature, polishing force, subsurface damage, dislocation, and stress were explored under different ultrasonic directions, frequencies and amplitudes through molecular dynamics (MD). For both vertical and horizontal vibration, the rising ultrasonic frequency and amplitude will reduce the tangential and normal force, and increase the subsurface temperature and the material removal rate (MRR). Higher frequencies promote the basal dislocation, thus reducing the subsurface damage. Higher amplitudes cause thinner subsurface damage layer under horizontal vibration. However, it is opposite at vertical vibration. The horizontal vibration can obtain a flatter polished surface and a thinner subsurface damage layer due to the longer trajectory and less impact on sapphire surface. This study can provide reference for sapphire high-quality polishing.

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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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