{"title":"一种新型电子发射显微镜的一些特点。","authors":"A Delong, V Drahos","doi":"10.1088/0022-3735/1/4/307","DOIUrl":null,"url":null,"abstract":"The article deals with the essential features of a new electron emission microscope, special attention being paid to the vacuum system and the objective lens. The vacuum of the order of 10 ntorr is attained in the specimen chamber with the help of an ion-getter pump, and the spectrum of residual gases is checked continuously during the operation. The rest of the optical system is evacuated by a conventional vacuum system with automatic valving. A specimen air-lock contributes to quick cycles of operation. Different kinds of emission microscopy are possible with the instrument. An example of the favourable influence of improved vacuum conditions in case of tunnel emission is given at the end.","PeriodicalId":16983,"journal":{"name":"Journal of Scientific Instruments","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1968-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1088/0022-3735/1/4/307","citationCount":"10","resultStr":"{\"title\":\"On some features of a new electron emission microscope.\",\"authors\":\"A Delong, V Drahos\",\"doi\":\"10.1088/0022-3735/1/4/307\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The article deals with the essential features of a new electron emission microscope, special attention being paid to the vacuum system and the objective lens. The vacuum of the order of 10 ntorr is attained in the specimen chamber with the help of an ion-getter pump, and the spectrum of residual gases is checked continuously during the operation. The rest of the optical system is evacuated by a conventional vacuum system with automatic valving. A specimen air-lock contributes to quick cycles of operation. Different kinds of emission microscopy are possible with the instrument. An example of the favourable influence of improved vacuum conditions in case of tunnel emission is given at the end.\",\"PeriodicalId\":16983,\"journal\":{\"name\":\"Journal of Scientific Instruments\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1968-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1088/0022-3735/1/4/307\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Scientific Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0022-3735/1/4/307\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Scientific Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0022-3735/1/4/307","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On some features of a new electron emission microscope.
The article deals with the essential features of a new electron emission microscope, special attention being paid to the vacuum system and the objective lens. The vacuum of the order of 10 ntorr is attained in the specimen chamber with the help of an ion-getter pump, and the spectrum of residual gases is checked continuously during the operation. The rest of the optical system is evacuated by a conventional vacuum system with automatic valving. A specimen air-lock contributes to quick cycles of operation. Different kinds of emission microscopy are possible with the instrument. An example of the favourable influence of improved vacuum conditions in case of tunnel emission is given at the end.
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