一种用场发射扫描电子显微镜观察重金属染色和包埋生物组织的新方法。

Scanning microscopy Pub Date : 1996-01-01
R G Richards, I ap Gwynn
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引用次数: 0

摘要

采用背散射电子(BSE)成像技术显示不同包埋标本中重金属染色的生物结构。将样品固定、染色并包埋在树脂块中,为透射电子显微镜(TEM)做准备。将标本块修剪成5平方毫米的梯形表面,并在其侧面涂上导电银漆,使表面裸露。用6- 8nm的银、铬或铝溅射涂层块,其中铝在BSE模式下提供最佳的样品对比度。样品在50 microA的高发射电流下用场发射扫描电子显微镜进行检测。优化固定方案和显微镜操作参数,以最大限度地从最小的探针获得疯牛病的数量。发现10 keV的加速电压对于分辨率和对比度是最佳的。该技术允许直接可视化嵌入样品的分辨率超过光学显微镜,具有良好的对比度,没有切割部分,避免网格条遮挡感兴趣的区域。二维图像提供了与疯牛病预测发射深度相关的样本内部结构的平均信息。该技术可用于病理检查中的快速诊断,或在最终修剪超薄切片以进行高分辨率TEM研究之前,对样品面部内感兴趣的区域进行常规预选。
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A novel method for viewing heavy metal stained and embedded biological tissue by field emission scanning electron microscopy.

Backscattered electron (BSE) imaging was used to display heavy metal stained biological structures of various embedded specimens. Samples were fixed, stained and embedded in resin blocks as with preparation for the transmission electron microscope (TEM). Blocks were trimmed to center the specimens in a trapezoidal face of up to 5 mm2 and their sides painted with conductive silver paint leaving the face uncovered. Blocks were sputter coated with 6-8 nm of silver, chromium or aluminum, with aluminum providing the best specimen contrast in BSE mode. Samples were examined in a field emission scanning electron microscope operated at a high emission current of 50 microA. Both the fixation protocol and microscope operating parameters were optimized to maximize the number of BSE available from the smallest probe. An accelerating voltage of 10 keV was found optimal for resolution and contrast. The technique allowed the direct visualization of embedded samples at resolutions beyond light microscopy with good contrast, without cutting sections, and avoiding grid bars obscuring areas of interest. The two dimensional images provided averaged information on the internal structures of the specimens in relation to the predicted emission depth of the BSE. The technique could be used for rapid diagnostics in pathological examinations, or for routine preselection of areas of interest within a sample face before final trimming for ultrathin sectioning for higher resolution TEM study.

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