有机/量子点混合光电器件用胶体纳米晶体薄膜的接触印刷。

Nano reviews Pub Date : 2012-01-01 Epub Date: 2012-04-09 DOI:10.3402/nano.v3i0.16144
Matthew J Panzer, Katherine E Aidala, Vladimir Bulović
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引用次数: 13

摘要

近年来,包含无机胶体半导体量子点(QDs)和有机半导体薄膜的新型薄膜光电器件得到了广泛的研究,用于各种应用。在这里,我们回顾了将这两种不同的材料类别整合到功能多层器件中的最通用和成功的方法之一:胶体量子点薄膜的接触印刷。概述了接触印刷过程的实验细节,并讨论了这种量子点沉积方法相对于其他常见技术的主要优点。还描述了使用攻丝模式原子力显微镜(AFM)来有效表征弹性印章(接触印刷之前)和转移到有机半导体接收膜(接触印刷之后)上的QD膜形态。最后,我们对未来的努力提出了建议,以实现在更大的衬底上快速、连续的量子点沉积,从而推进混合光电薄膜器件的发展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Contact printing of colloidal nanocrystal thin films for hybrid organic/quantum dot optoelectronic devices.

Novel thin film optoelectronic devices containing both inorganic colloidal semiconductor quantum dots (QDs) and organic semiconductor thin films have been widely investigated in recent years for a variety of applications. Here, we review one of the most versatile and successful methods developed to integrate these two dissimilar material classes into a functional multilayered device: contact printing of colloidal QD films. Experimental details regarding the contact printing process are outlined, and the key advantages of this QD deposition method over other commonly encountered techniques are discussed. The use of tapping mode atomic force microscopy (AFM) to effectively characterize QD film morphology both on an elastomeric stamp (before contact printing) and as-transferred to the organic semiconductor receiving film (after contact printing) is also described. Finally, we offer suggestions for future efforts directed toward the goal of rapid, continuous QD deposition over larger substrates for the advancement of hybrid optoelectronic thin film devices.

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