三维x射线显微镜分析假体负载种植体与平台切换和锥形连接:1例报告。

ORAL and Implantology Pub Date : 2017-11-30 eCollection Date: 2017-07-01 DOI:10.11138/orl/2017.10.3.241
M DI Girolamo, L Baggi, P Pirelli, L Pappalardo, G Massei, F Iaculli, G Iezzi, A Piattelli, R Calcaterra
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引用次数: 0

摘要

组织学和组织形态学检查是对种植体周围组织进行定性和定量分析的金标准。近年来,显微镜领域见证了显微镜性能的显著提高,显微镜具有非常高的分辨率,可以进行非常复杂的分析,甚至比传统的制备更大。对整个种植体和周围不同组织(软组织和硬组织)进行经济分析的可能性,而无需传统的组织学分析所需的预处理,可能代表了描述材料特性和行为或简单地可视化结构细节的目标。本研究的目的是评估种植体周围组织的3D x射线显微分析,与传统的种植体周围组织的组织学和组织形态计量学分析相比,种植体周围组织的锥形连接与平台切换相关,以评估新分析技术的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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3D X-ray microscopic analysys on a prosthetically loaded implant with platform-switching and conical connection: a case report.

The histological and histomorphometrical examination were the gold standard in the qualitative and quantitative analyses of the peri-implant tissue around the implant. In recent years, the field of microscopy has witnessed a considerable enhancement of the performance of microscopes that have very high resolution performance and allowing very sophisticated analysis even larger than traditional preparations. The possibility to have an affordable analyses of whole implant with the surrounding different tissues (soft and hard tissues) without the traditional pre-treatment necessary for the histological analysis may represent a goal to describe material properties and behaviors or simply to visualize structural details. The aim of the present study were to evaluate a 3D X-ray microscopic analysis of peri-implant tissue compared to a traditional histological and histomorphometrical analysis of the peri-implant tissues around an implant with a conical connection associated with platform-switching in order to assess the validity of the new analysis technique.

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ORAL and Implantology
ORAL and Implantology Dentistry-Dentistry (all)
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