时间对工作记忆门控过程的影响——Theta同步和去甲肾上腺素系统的作用。

Cerebral cortex communications Pub Date : 2022-01-13 eCollection Date: 2022-01-01 DOI:10.1093/texcom/tgac001
Shijing Yu, Moritz Mückschel, Sarah Rempel, Tjalf Ziemssen, Christian Beste
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引用次数: 2

摘要

长期从事一项特定的工作,通常会导致工作表现受损。尽管这在日常生活中是一个众所周知的效应,但人们对它如何影响工作记忆(WM)过程等核心认知功能却知之甚少。在当前的研究中,我们探讨了任务时间如何影响WM门控过程,从而影响调节WM维护和更新的过程。为此,我们结合脑电图方法和瞳孔直径的记录作为去甲肾上腺素(NE)系统活性的间接指标。我们的研究结果表明,只有WM门打开过程存在时间-任务效应,而关闭过程没有。在神经生理水平上,这与背外侧前额叶θ波带同步过程的调节有关,该过程在WM门打开期间随着任务时间的推移而消失。有趣的是,根据瞳孔直径数据推断,NE系统的调节模式也发生了变化。首先,在WM栅极开启过程中,瞳孔直径数据与θ波段同步过程具有很强的相关性。这种调节作用在实验结束时消失了。结果表明,任务时间对WM门的开启和关闭过程有非常具体的影响,表明NE系统在任务时间对WM门开启过程的影响中起重要作用。
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Time-On-Task Effects on Working Memory Gating Processes-A Role of Theta Synchronization and the Norepinephrine System.

Performance impairment as an effect of prolonged engagement in a specific task is commonly observed. Although this is a well-known effect in everyday life, little is known about how this affects central cognitive functions such as working memory (WM) processes. In the current study, we ask how time-on-task affects WM gating processes and thus processes regulating WM maintenance and updating. To this end, we combined electroencephalography methods and recordings of the pupil diameter as an indirect of the norepinephrine (NE) system activity. Our results showed that only WM gate opening but not closing processes showed time-on-task effects. On the neurophysiological level, this was associated with modulation of dorsolateral prefrontal theta band synchronization processes, which vanished with time-on-task during WM gate opening. Interestingly, also the modulatory pattern of the NE system, as inferred using pupil diameter data, changed. At the beginning, a strong correlation of pupil diameter data and theta band synchronization processes during WM gate opening is observed. This modulatory effect vanished at the end of the experiment. The results show that time-on-task has very specific effects on WM gate opening and closing processes and suggests an important role of NE system in the time-on-task effect on WM gate opening process.

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