利用透射电子显微镜分析二维材料的微观结构及相关性能

Q3 Immunology and Microbiology Applied Microscopy Pub Date : 2019-11-04 DOI:10.1186/s42649-019-0013-5

Yun-Yeong Chang, Heung Nam Han, Miyoung Kim

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引用次数: 9

摘要

二维材料，如过渡金属二硫化物和石墨烯，由于其有趣的电子和光学性质，如基于结构变化的金属-绝缘体过渡，引起了人们的极大兴趣。因此，用透射电子显微镜详细分析结构的可调性对于理解原子构型变得越来越重要。本文综述了一些应用透射电子显微镜分析二维材料的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy

Two-dimensional materials such as transition metal dichalcogenide and graphene are of great interest due to their intriguing electronic and optical properties such as metal-insulator transition based on structural variation. Accordingly, detailed analyses of structural tunability with transmission electron microscopy have become increasingly important for understanding atomic configurations. This review presents a few analyses that can be applied to two-dimensional materials using transmission electron microscopy.

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来源期刊

Applied Microscopy Immunology and Microbiology-Applied Microbiology and Biotechnology

CiteScore

3.40

自引率

0.00%

发文量

审稿时长

10 weeks

期刊介绍： Applied Microscopy is a peer-reviewed journal sponsored by the Korean Society of Microscopy. The journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or materials science for determining structure and chemistry. ISSN: 22875123, 22874445.