光谱STXM中的数据分析

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI:10.1016/j.elspec.2023.147310
Matthew A. Marcus
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引用次数: 2

摘要

STXM(扫描透射x射线(光谱)显微镜)测量的典型输出是一个数据立方体,由一组在入射能量序列下拍摄的图像(像素网格上x射线透射的测量)组成。与任何实验测量一样,必须将这些原始数据简化为某种标准形式并进行解释。在本文中,我回顾了如何从原始数据到样本信息的基础知识。我将讨论x射线光谱显微镜的基本原理,数据还原,描述性和基于模型的分析,以及可用的软件,并从文献中取了例子。
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Data analysis in spectroscopic STXM

The typical output of a STXM (Scanning Transmission X-ray (spectro)Microscopy) measurement is a data cube consisting of a set of images (measurements of X-ray transmission at a grid of pixels) taken at a sequence of incident energies. As with any experimental measurement, this raw data must be reduced to some standard form and interpreted. In this paper, I review the basics of how to go from raw data to information about the sample. I will discuss the fundamentals of X-ray spectromicroscopy, data reduction, descriptive and model-based analysis, and available software, with examples taken from the literature.

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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
期刊最新文献
Theory of circular dichroism in angle- and spin-resolved photoemission from the surface state on Bi(111) Atomic data, and ionization cross-sections by electron impact of tungsten ions, W LXV Elucidating the structure of amorphous-carbon films containing carbide and non-carbide-forming metals Encoder–decoder neural networks in interpretation of X-ray spectra Editorial Board
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