一种利用开关谐振网络的68 db隔离1.0 db损耗紧凑型CMOS SPDT射频开关

Xi Fu, Yun Wang, Zheng Li, A. Shirane, K. Okada
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引用次数: 6

摘要

本文设计了一种端口隔离为68 db、插入损耗为1.0 db的单极双掷(SPDT) ku波段射频开关,该开关采用一种新颖的开关并联LC谐振网络。在9ghz ~ 19ghz范围内,测量到的隔离度高于50db。SPDT射频开关由两个采用体浮技术的串联并联晶体管开关对和一个开关并联LC网络组成。该网络使用一个关断的串联晶体管来谐振出离容差。SPDT RF开关采用标准65纳米CMOS技术制造。测量结果表明,在中心频率为15 GHz时,端口到端口的隔离度为68 db,插入损耗为1.0 db。测量的输出三阶截距(OIP3)高于21 dBm,片上核心尺寸为0.034 mm2。所提出的SPDT射频开关在8 GHz至20 GHz范围内保持所有工作端口的回波损耗小于10 dB。
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A 68-dB Isolation 1.0-dB Loss Compact CMOS SPDT RF Switch Utilizing Switched Resonance Network
In this paper, a single-pole double-throw (SPDT) Ku-band RF switch with 68-dB port isolation and 1.0-dB insertion loss is presented with a novel switched parallel LC resonance network. The measured isolation is higher than 50 dB from 9 GHz to 19 GHz. The SPDT RF switch composes of two series-shunt transistor switch pairs with body-floating technology and a switched parallel LC network. The network uses a turned-off series transistor to resonate out off-capacitance Coff. The SPDT RF switch is fabricated in standard 65 nm CMOS technology. The measured results show the port-to-port isolation of 68-dB with 1.0-dB insertion loss at the center frequency of 15 GHz. The measured output third-order intercept (OIP3) is higher than 21 dBm with a 0.034 mm2 compact on-chip core size. The proposed SPDT RF switch maintains return losses of all working ports less than 10 dB from 8 GHz to 20 GHz.
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