动态测试技术的数学方法

{"title":"动态测试技术的数学方法","authors":"N. Nakamura, H. Katoh, Y. Teramoto","doi":"10.1007/BF02546895","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":17333,"journal":{"name":"Journal of thermal analysis","volume":"99 1","pages":"1313-1320"},"PeriodicalIF":0.0000,"publicationDate":"1993-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Mathematical approach for the dynamic testing technique\",\"authors\":\"N. Nakamura, H. Katoh, Y. Teramoto\",\"doi\":\"10.1007/BF02546895\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":17333,\"journal\":{\"name\":\"Journal of thermal analysis\",\"volume\":\"99 1\",\"pages\":\"1313-1320\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of thermal analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/BF02546895\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of thermal analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/BF02546895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}