环氧/蒙脱土纳米复合材料和纳米结构环氧/SiO2/蒙脱土微复合材料的介电性能

H. Couderc, S. Savoie, M. Frechette, É. David, F. Guastavino, A. S. Thelakkadan, G. Coletti, A. Fina
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引用次数: 4

摘要

微复合材料是一类众所周知的材料。聚合物基体性能的增强可以用经典的混合定律来解释。但当包裹体尺寸减小到纳米级时,性能的改善不再是由于混合效应,而是由于纳米颗粒在基体上的界面影响。一类新兴的材料是用纳米颗粒增强聚合物基质的微粒增强复合材料。为了研究这种新材料的介电性能,以石英为微填料,有机改性蒙脱土为纳米填料制备了环氧复合材料。利用透射电子显微镜对复合材料的结构进行了分析,发现C30B叠层厚度在纳米级范围内,但叠层既没有脱落,也没有插层。采用差示扫描量热法研究了纳米和微粒子对环氧基非晶结构的影响。C30B的加入对玻璃化转变温度影响不大,但微粒的加入使玻璃化转变温度从357K急剧下降到325K。除微复合材料外,热容步骤基本不变。最后,利用宽带介电光谱研究了材料在不同温度和频率下的介电特性。研究了与局部β、γ弛豫和主α弛豫有关的弛豫时间和介电强度。
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Dielectric properties of epoxy/Montmorillonite nanocomposites and nanostructured epoxy/SiO2/Montmorillonite microcomposites
Microcomposites are a well known class of materials. The enhancement of polymer matrix properties can be explained by the classical mixing law. But if the inclusion size is decreased to reach the nanometric range, the improvement of properties is no more due to mixing effect but to the influence of interface of nanoparticles on the matrix. A new emerging class of materials is composites reinforced with microparticles using a polymer matrix reinforced by nanoparticles. In order to study dielectric properties of such new materials, epoxy composites have been prepared using quartz as micro filler and organically modified Montmorillonite as nanofiller. Transmission Electron Microscopy has been used to determine the structure of the composites, which is neither exfoliated nor intercalated although the C30B stacks thickness is in the nanometric range. Differential Scanning Calorimetry experiments have been carried out to highlight the nano and microparticles effect on the epoxy matrix amorphous structure. The glass transition temperature is slightly affected by C30B addition but the microparticles inclusion produces a drastic decrease from 357K to 325K. The heat capacity step is rather unchanged except for the microcomposite. And finally, the dielectric properties of the materials have been studied by Broadband Dielectric Spectroscopy at different temperatures and frequencies. The relaxation times and the dielectric strengths associated with local β and γ relaxations and main α relaxation have been studied.
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