Restore-L相机光学元件在模拟轨道辐射环境下的曝光

K. Miller, J. Heaney, J. Lauenstein, S. K. Brown, K. M. O'Connor, S. K. Miller
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摘要

本文报道了可见光波长相机光学元件在模拟轨道辐射环境下的曝光,以支持美国宇航局戈达德太空飞行中心的Restore-L飞行项目。将含有不同金属氧化物掺杂剂(S-LAL8、S-LAL18、N-SF1)的硼硅酸盐玻璃和聚碳酸酯材料Makrolon GP暴露于不同能量的电子和质子中。低能(E≤10keV)带电粒子主要用于评估光学元件抗反射涂层的降解情况。用高能(E ~ 1mev)带电粒子评价了对大块材料的降解。将S-LAL18、N-SF1、LaK9G15和Makrolon GP元素暴露在具有代表性的富原子氧环境中。将S-LAL8和Makrolon GP元素暴露于强紫外辐射下。在0.3至1.2微米波长范围内,使用曝光前和曝光后透射率测量来量化对模拟环境中测试元素的影响。我们的测量结果将在其对轨道环境的稳健性和测试材料的已知化学成分的背景下进行讨论。
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Exposure of Restore-L camera optical elements to a simulated orbital radiation environment
This paper reports on the exposure of visible wavelength camera optical elements to a simulated orbital radiation environment in support of the Restore-L flight project at NASA’s Goddard Space Flight Center. Borosilicate glasses with various metal oxide dopants - S-LAL8, S-LAL18, N-SF1, and the polycarbonate material Makrolon GP were exposed to electrons and protons of varying energies. Low energy (E ≤ 10keV) charged particles were used primarily to assess degradation to the antireflective coatings of the optical elements. High energy (E ~ 1 MeV) charged particles were used to evaluate degradation to the bulk material. Elements of S-LAL18, N-SF1, LaK9G15, and Makrolon GP were exposed to a representative atomic oxygen rich environment. Elements of S-LAL8 and Makrolon GP were exposed to intense ultraviolet radiation. Pre- and post-exposure transmittance measurements were used to quantify the effects on the elements tested in the simulated environment over the 0.3 to 1.2 micron wavelength range. Our measurement results will be discussed in the context of their robustness to the orbital environment and the known chemical constituents of the materials tested.
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