利用现场数据监测竞争风险下的可靠性

IF 2.6 2区 工程技术 Q2 ENGINEERING, INDUSTRIAL Journal of Quality Technology Pub Date : 2022-07-13 DOI:10.1080/00224065.2022.2080617
F. Pascual, Joseph P. Navelski
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引用次数: 0

摘要

许多现代产品的失败都是由于竞争风险造成的。在本文中,我们提出了在竞争风险下用控制图监测产品失效的可变特征。故障报告每次从单元总体样本中到达一个。特征来源于报告和假设的竞争风险统计模型。为了评估不同特征子集在故障时间过程中检测位移的有效性,我们考虑了基于随机森林的控制图,并比较了不同位移场景下的平均运行长度性能。我们用一个咨询问题的模拟数据集和实际现场数据集来演示控制图。我们还提出了图形故障诊断方法来识别报警信号的可分配原因。基于所提出的特性的控制图将为制造商在计划保修、零件更换或维修时提供有价值的信息。
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Monitoring reliability under competing risks using field data
Abstract Many modern products fail due to one of multiple causes called competing risks. In this article, we propose variable features for monitoring product failure by control charts under competing risks. Failure reports arrive one at a time from a sample of population of units. Features are derived from both the reports and the assumed competing-risk statistical model. To assess the efficacy of different feature subsets in detecting shifts in the failure-time process, we consider control charts based on random forests and compare the average run length performances under different shift scenarios. We demonstrate the control charts with both simulated data sets and actual field data set from a consulting problem. We also propose graphical fault-diagnosis methods for identifying assignable causes of alarm signals. Control charts based on the proposed features will provide valuable information to manufacturers in planning for warranty, part-replacement, or repair.
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来源期刊
Journal of Quality Technology
Journal of Quality Technology 管理科学-工程:工业
CiteScore
5.20
自引率
4.00%
发文量
23
审稿时长
>12 weeks
期刊介绍: The objective of Journal of Quality Technology is to contribute to the technical advancement of the field of quality technology by publishing papers that emphasize the practical applicability of new techniques, instructive examples of the operation of existing techniques and results of historical researches. Expository, review, and tutorial papers are also acceptable if they are written in a style suitable for practicing engineers. Sample our Mathematics & Statistics journals, sign in here to start your FREE access for 14 days
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