单元件液晶器件光学特性分析

G. M. Storrow, H. Gleeson, A. Murray
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引用次数: 2

摘要

相位成像用于可视化电控双折射液晶器件的光学特性,特别强调电极边缘。所使用的仪器是一种改进的迈克尔逊干涉仪,数据是用商用软件在个人电脑上操作的。元件的相位变化原则上在电极边缘处是不连续的。然而,在含有向列材料E49的厚器件中,通过测量直接驱动的方形电极图案,可以观察到相位梯度延伸到电极边缘以外,该器件约高于阈值0.75 V。从电场的条纹和元件相边界处的衍射角度讨论了相梯度。
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An analysis of the optical properties of a single-element liquid crystal device
Phase imaging is employed to visualize the optical properties of an electrically controlled birefringent liquid crystal device with particular emphasis being paid to the electrode edges. The apparatus used is a modified Michelson interferometer and the data are manipulated on a personal computer using commercially available software. The phase variation of the element is in principle discontinuous at the electrode edge. However, a phase gradient is observed that is measured to extend beyond the electrode edges by for a directly driven square electrode pattern in a thick device which contains the nematic material E49 approximately 0.75 V above threshold. The phase gradient is discussed in terms of fringing of the electric fields and diffraction at the phase boundary in the element.
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